software package developed by the Antwerp X-ray Imaging/Instrumentation Laboratory (AXiL) at the University of Antwerp. Its main purpose is to automate the processing of two dimensional x-ray diffraction images from scanning micro-XRPD or micro-XRPD tomography. It accepts images from flat area detectors and allows correction, calibration and modeling (Rietveld, Pawley, Pattern Decomposition). The primary goal is to visualize crystalline phase distributions in projection (2D scanning) or in a virtual cross section (tomography) of the object under investigation. Apart from the amount of material, structural properties and their changes within the object can be calculated and visualized as well.