XDS

X-ray Detector Software for processing single-crystal monochromatic diffraction data recorded by the rotation method.
It processes a sequence of adjacent, nonoverlapping rotation images collected from a single-crystal at a fixed X-ray wavelength and recorded by a variety of imaging plate, CCD, pixel and multiwire area detectors;

allows arbitrary but fixed orientations of the detector and rotation axis, and only requires that incident beam and rotation axis intercept in one point in the center of the crystal;
automatically derives reflecting range, spot width, crystal orientation, symmetry, and cell parameters from the data images.
delivers a list of corrected integrated intensities of the reflections occuring in the data images.