RFIT2000 fits X-ray and neutron reflectivity data. The search of global minima is done via successive descent from local minima. This method can be treated as a two stage loop repeated consequently. The first stage is the local minimization with the ?2 -like criterion and the second one is the descent from the most recent local minimum. Reflectivity curve is calculated with one of the methods: Kinematic, Parratt and Matrix. Matrix method works faster for films modeled with multiple repetion of one identcal structural units. Film structure is represented with the box model. Each box is characterized with the scattering density (Re and Im), thickness and roughness of the top interface.
|Categories||Data analysis Visualization XRR|
|Hardware Requirements||PC with a 32-bit Microsoft Windows operating system||Platforms||Windows|
Package downloadable from here:
|Documentation / Tutorials|
Samoilenko I.I., Shchedrin B.M., Feigin L.A. Global minimization in reconstraction of the scattering-length density profile by X-ray reflectivity data. Phys.B., v.221, 1996, p.542-546 download from here
Samoilenko I.I., Shchedrin B.M., Feigin L.A Kristallografiya, 1995, v. 40, n. 5, p.801-808 (russian and english)
Konovalov O.V., Feigin L.A., Shchedrin B.M. Statistical evaluation of the accuracy of structure parameters determination from X-ray and neutron reflectivity data. Kristallografiya, 1996, v. 41, n. 4, p. 640-643
Konovalov O.V, Samoilenko I.I., Feigin L.A., Shchedrin B.M. Application of normalizing function in the simulation of X-ray and neutron reflectivity data. Kristallografiya, 1996, v. 41, n. 4, p.635-639
Konovalov O.V, Feigin L.A., Shchedrin B.M. Allowance for apparatus distortion in modeling the srtucture of Langmuir - Blodgett films from reflectivity data. Kristallografiya, 1996, v. 41, n. 4, p.629-634
I.I. Samoilenko, O.V. Konovalov, L.A. Feigin, B.M. Shchedrin, L.G. Yanusova, Processing of experimental reflectivit y data within the REFLAN software package. Kristallografiya, 1999,v.44, n.2, p.310-318.
O.V. Konovalov, I.I. Samoilenko, L.A. Feigin, B.M. Shchedrin, L.G. Yanusova, Statistical substantiation of parametrization of a film model in reflectometry. Kristallografiya, 1999,v.44, n.2, p.319-323.