BINoculars is a tool for data reduction and analysis of large sets of surface diffraction data that have been acquired with a 2D X-ray detector. The intensity of each pixel of a 2D-detector is projected onto a 3-dimensional grid in reciprocal lattice coordinates using a binning algorithm. This allows for fast acquisition and processing of high-resolution datasets and results in a significant reduction of the size of the dataset. The subsequent analysis then proceeds in reciprocal space. It has evolved from the specific needs of the ID03 beamline at the ESRF, but it has a modular design and can be easily adjusted and extended to work with data from other beamlines or from other measurement techniques.
BornAgain is a software package to simulate and fit small-angle scattering at grazing incidence. It supports analysis of both X-ray (GISAXS) and neutron (GISANS) data. Its name, BornAgain, indicates the central role of the distorted wave Born approximation in the physical description of the scattering process. The software provides a generic framework for modeling multilayer samples with smooth or rough interfaces and with various types of embedded nanoparticles.
DYNA (or "Dynamic x-ray reflectivity (off-or-on resonance regime for isotropic, anisotropic and magnetic multilayers) simulation program") is a simulation tool to analyze structural, magnetic and electronic profiles along the growth direction of ultrathin layers. It simulates conventional x-ray or optical reflectivity, resonant (or "anomalous") x-ray reflectivity, "orbital reflectometry", magnetic resonant x-ray reflectivity with applications to magnetic or anisotropic layers, in hard or soft matter. Dyna is an on-going open-source project, that uses Matlab environment, the move to Python + Qt being in progress.
RFIT2000 fits X-ray and neutron reflectivity data. The search of global minima is done via successive descent from local minima. This method can be treated as a two stage loop repeated consequently. The first stage is the local minimization with the ?2 -like criterion and the second one is the descent from the most recent local minimum. Reflectivity curve is calculated with one of the methods: Kinematic, Parratt and Matrix. Matrix method works faster for films modeled with multiple repetion of one identcal structural units. Film structure is represented with the box model. Each box is characterized with the scattering density (Re and Im), thickness and roughness of the top interface.
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