MAUD
Materials Analysis Using Diffraction: A Rietveld extended program to perform combined analyses. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons
| Website | http://maud.radiographema.com/ |
| Licenses | Academic Free License 3.0 |
| Categories | Data analysis Visualization |
| Software Requirements | - |
| Hardware Requirements | - | Platforms | Mac OS Linux Windows |
| Languages | C++ |
| Input Formats | GIF JPEG TIFF - Hamamatsu |
| Output Formats | ASCII |
| Contact email | Luca.Lutterotti@ing.unitn.it |
| How-to | |
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Installed on Windows PCs at ID11 |
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| Documentation / Tutorials | |
| References | |
|
L. Lutterotti, S. Matthies, and H.-R. Wenk. MAUD: a friendly Java program for material analysis using diffraction. IUCr: Newsletter of the CPD, 21:14-15, 1999. |
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| Instruments | ID11 (ESRF) |
This software is used at these institutes
No example datasets have been uploaded for this software.
