MAUD


Materials Analysis Using Diffraction: A Rietveld extended program to perform combined analyses. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons

Website http://maud.radiographema.com/
Licenses Academic Free License 3.0
Categories Data analysis Visualization
Software Requirements -
Hardware Requirements -
Platforms Mac OS Linux Windows
Languages C++
Input Formats GIF JPEG TIFF - Hamamatsu
Output Formats ASCII
Contact email Luca.Lutterotti@ing.unitn.it
How-to

Installed on Windows PCs at ID11

Documentation / Tutorials

Tutorials

Video

References

L. Lutterotti, S. Matthies, and H.-R. Wenk. MAUD: a friendly Java program for material analysis using diffraction. IUCr: Newsletter of the CPD, 21:14-15, 1999.

Instruments ID11 (ESRF)
This software is used at these institutes
No example datasets have been uploaded for this software.