Data analysis of EXAFS spectra using the fast spherical wave method. It provides an integrated environment for the analysis of EXAFS spectra while delivering a platform for the fast spherical wave method. The current version is based on this method for single scattering, but uses the method of Lee and Pendry (1975) for the exact polarisation dependent theory. Multiple scattering has options to use several methods. It allows fitting of both background-subtracted, and normalised total absorbance spectra. In the latter case the program calculates the atomic contribution of the spectrum (whole-spectrum fitting). The purpose of the program is to find a structural model of a material which agrees with the available XAFS spectra.

This program (without GUI) was formerly called EXCURVE and is the one installed at the ESRF

Website http://www.cse.scitech.ac.uk/cmg/EXCURV/
Licenses Software subject to license fees
Categories Data analysis Sample simulation XAFS
Software Requirements -
Hardware Requirements -
Platforms Mac OS Linux Windows
Languages Fortran
Input Formats ASCII
Output Formats ASCII
Contact email s.tomic@dl.ac.uk

Installed on the central ESRF cluster and callable via:


Documentation / Tutorials

EXCURVE User guide DL-EXCURVE/EXCURVE combined tutorial


CCLRC Technical Report DL-TR-2005-001, ISSN 1362-0207 (2005) S. Tomic et al

Instruments BM26A (ESRF)
This software is used at these institutes
There are 1 example datasets for this software
File Size Download
examples.tar.gz 130.3 kB Download