The X-ray Strain Orientation Calculation Software (X-SOCS) is a user-friendly program, which has been developed at ID01 for analysis of the spec-file and images recorded during continuous mapping measurements. X-SOCS aims at retrieving strain and tilt maps of nanostructures, films, surfaces or even embedded structures. It offers the opportunity to get preliminary results directly at the beamline giving the user the opportunity to adapt the planning of the experiments and the measurements with respect to this first set of results. This is of particular importance for the application of such fast scanning methods to in operando studies at high temperatures or in gas or liquid environments.


X-ray Detector Software for processing single-crystal monochromatic diffraction data recorded by the rotation method. It processes a sequence of adjacent, nonoverlapping rotation images collected from a single-crystal at a fixed X-ray wavelength and recorded by a variety of imaging plate, CCD, pixel and multiwire area detectors; allows arbitrary but fixed orientations of the detector and rotation axis, and only requires that incident beam and rotation axis intercept in one point in the center of the crystal; automatically derives reflecting range, spot width, crystal orientation, symmetry, and cell parameters from the data images. delivers a list of corrected integrated intensities of the reflections occuring in the data images.

XOP (includes SHADOWVUI)

XOP (X-ray Oriented Programs) is a widget-based driver program used as a common front-end interface for modelling of x-ray sources characteristics of optical devices (mirror, filters, crystals, multilayers, etc.); multipurpose data visualizations and analyses