TOPAS
Profile and structure analysis software for powder and single crystal data XRD. Profile and structure analysis by integrating a large wealth of profile fitting techniques as well as related applications. Single Line Fitting Indexing (LSI and LP-Search methods) Whole Powder Pattern Decomposition (Pawley and Le Bail methods) Ab-initio structure determination in direct space from powder and single crystal data Rietveld structure refinement Quantitative Rietveld analysis
| Website | https://www.bruker.com/products/x-ray-diffraction-and-elemental-analysis/x-ray-diffraction/xrd-software/topas.html |
| Licenses | Software subject to license fees |
| Categories | Data analysis Sample simulation Powder Diffraction Single Crystal Diffraction |
| Software Requirements | - |
| Hardware Requirements | - | Platforms | Windows |
| Languages | There are no languages associated to this software. |
| Input Formats | RAW FullProf XYE GSAS |
| Output Formats | CIF |
| Contact email | fitch@esrf.fr |
| How-to | |
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Executable downloadable from P:\EXP\SoM\TOPAS-5.0 Readme file here: User manual and tutorial available in: P:\EXP\SoM\TOPAS-5.0\Documents The User Documentation is available in: P:\EXP\SoM\TOPAS-5.0\Documents |
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| Documentation / Tutorials | |
| There are no tutorials or documentation for this software. | |
| References | |
| No references have been added for this software. | |
| Instruments | ID11 (ESRF) ID15A (ESRF) ID15B (ESRF) ID22 (ESRF) |
This software is used at these institutes
There are 1 example datasets for this
software
| File | Size | Download |
|---|---|---|
| Tutorial.zip | 11.8 MB | Download |
