Profile and structure analysis software for powder and single crystal data XRD. Profile and structure analysis by integrating a large wealth of profile fitting techniques as well as related applications. Single Line Fitting Indexing (LSI and LP-Search methods) Whole Powder Pattern Decomposition (Pawley and Le Bail methods) Ab-initio structure determination in direct space from powder and single crystal data Rietveld structure refinement Quantitative Rietveld analysis

Licenses Software subject to license fees
Categories Data analysis Sample simulation Powder Diffraction Single Crystal Diffraction
Software Requirements -
Hardware Requirements -
Platforms Windows
Languages There are no languages associated to this software.
Input Formats RAW FullProf XYE GSAS
Output Formats CIF
Contact email

Executable downloadable from P:\EXP\SoM\TOPAS-5.0

Readme file here:

User manual and tutorial available in: P:\EXP\SoM\TOPAS-5.0\Documents

The User Documentation is available in: P:\EXP\SoM\TOPAS-5.0\Documents

Documentation / Tutorials
There are no tutorials or documentation for this software.
No references have been added for this software.
Instruments ID11 (ESRF) ID15A (ESRF) ID15B (ESRF) ID22 (ESRF)
This software is used at these institutes
There are 1 example datasets for this software
File Size Download 11.8 MB Download